Spatially Resolved Characterization
For high-throughput experiments, NREL has spatially resolved measurement capabilities, also known as mapping capabilities, and specialized characterization instruments.
Our large number of single-point, specialized characterization instruments allows us to study in more detail the most interesting points on the combinatorial libraries.
Chemical Composition Mapping
Method: X-ray fluorescence (XRF)
Instrument: Fisher XDV XRF
Measures: Composition and thickness
Samples: <12" square
Resolution: 0.3-3 mm
Time per point: 3-5 min
Features: Ti lightest element
Method: X-ray fluorescence (XRF)
Instrument: Fisher XUV XRF
Measures: Composition and thickness
Samples: <6" square
Resolution: 0.3-3 mm
Time per point: 3-5 min
Features: >Al, vacuum
Method: X-ray fluorescence (XRF)
Instrument: Bruker Tornado XRF
Measures: Composition and thickness
Samples: <6" square
Resolution: 0.01-3 mm
Time per point: 3-5 min
Features: >Al, vacuum, micro
Method: Rutherford back scattering (RBS)
Instrument: National Electrostatics Corp RBS
Measures: Composition and thickness
Samples: <2" square
Resolution: 1 mm
Time per point: 30 min
Features: >N, vacuum
Method: Photoemission Spectroscopy
Instrument: Kratos Nova XPS
Measures: Fermi level and work function
Samples: <6" square
Resolution: 1 mm
Time per point: 30 min
Features: Vacuum transfer
Crystal Structure Mapping
Method: X-ray diffraction (XRD)
Instrument: Bruker D8 Discover XRD
Measures: Structure and phase content
Samples: <4" square
Resolution: 1-2 mm
Time per point: 3-5 min
Features: 2D detector
Method: Raman and photoluminescence
Instrument: Renishaw in Via Raman Microscope
Measures: Vibration modes and phase ID
Samples: <2" square
Resolution: 1 um
Time per point: 5 min
Features: Multiple lasers
Optical Property Mapping
Method: Optical spectroscopy
Instrument: Custom with Ocean Optics Spectrometer
Measures: Bandgap and absorption coefficient
Samples: <6" square
Resolution: 1 mm
Time per point: 3 sec
Features: Diffuse and specular ultraviolet visible spectroscopy (UV-Vis-NIR)
Method: Spectroscopic ellipsometry
Instrument: J.A. Woollam Ellipsometer
Measures: Thickness and refractive index
Samples: <6" square
Resolution: 1 mm
Time per point: 10 sec
Features: Variable angle and UV-VIS-NIR
Method: Fourier Transform infrared spectroscopy (FTIR)
Instrument: Thermo Scientific FTIR
Measures: Plasmons and vibrations
Samples: <6" square
Resolution: 3 mm
Time per point: 5 sec
Features: 1.8-25 um
Method: Colorimetry
Instrument: Epson Perfection V850 photo scanner
Measures: Film images and color
Samples: <8" square
Resolution: 1 um
Time per point: <1 sec
Features: Custom holder and software
Electrical Property Mapping
Method: 4-point probe
Instrument: Custom 4-point probe
Measures: sheet resistance
Samples: 2" square
Resolution: 3 mm
Time per point: 15 sec
Features: Heaters for measuring Seebeck
Method: Two-terminal measurements
Instrument: Custom JV/CV/IS
Measures: Resistance, capacitance, and impedance
Samples: <6" square
Resolution: 1 mm
Time per point: 5-30 sec
Features: Solar simulator and T/ambient control
Method: Three-terminal measurements
Instrument: Keithley 4200
Measures: Transistor and capacitor characteristics
Samples: <3" square
Resolution: 1 mm
Time per point: 10 min
Features: Microscope probe station
Method: Kelvin probe measurement
Instrument: KP Technology
Measures: Work function and surface photovoltage
Samples: <6" square
Resolution: 1 mm
Time per point: 10 sec
Features: Variable angle and UV-ViS-NIR
Surface Property Mapping
Method: Thickness profilometry
Instrument: Dektak Profilometer
Measures: Film thickness
Samples: <6" round
Resolution: 1 um
Time per point: 30 sec
Features: Holders and analysis software for full wafer mapping
Method: Scanning droplet cell (SDC) mapping
Instrument: Custom SDC instrument
Measures: Cyclic voltammetry and photocurrent
Samples: <2" square
Resolution: 2 mm
Time per point: 30 sec
Features: Corrosion testing and LED-based light
Method: Contact angle measurement
Instrument: Kruss-Scientific
Measures: Contact angle
Samples: <6" square
Resolution: 3 mm
Time per point: 15 sec
Features: Custom solutions
Method: Atomic force microscopy (AFM)
Instrument: Bruker AFM
Measures: Root mean square roughness and grain size
Samples: <6" square
Resolution: 1 nm
Time per point: 30 min
Features: Vacuum transfer
Publications
Instrument for Spatially Resolved, Temperature-Dependent Electrochemical Impedance Spectroscopy of Thin Films Under Locally Controlled Atmosphere, Review of Scientific Instruments (2021)
Combinatorial In Situ Photoelectron Spectroscopy Investigation of Sb2Se3/ZnS Heterointerfaces, Adv. Mater. Interfaces (2016)
Development and Application of an Instrument for Spatially Resolved Seebeck Coefficient Measurements, Rev. Sci. Instrum. (2013)
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Last Updated Jan. 6, 2025